Web of Conferences
Free access
Issue EPJ Web of Conferences
Volume 24, 2012
Environmental Radioactivity 2010
Article Number 07008
Number of page(s) 9
Section New Analytical Technologies
DOI http://dx.doi.org/10.1051/epjconf/20122407008
Published online 04 April 2012

  • J. Mengali, E. Paskell, R. W. Beck, and C. S. Peet, Proceedings of the Second Conference on Nuclear Radiation Effects on Semiconductor Devices, Materials and Circuits, Sept. 1959.
  • John M. Swartz and Marlin O. Thurston, Analysis of the Effect of Fast-Neutron Bombardment on the Current-Voltage Characteristic of a Conductivity-Modulated p-i-n Diode, Journal of Applied Physics 37 (1966) 745–754. [CrossRef]
  • R. Korde, A. Ojha et al., The effect of neutron irradiation on silicon photodiodes, IEEE Transactions on Nuclear Science 36 (1989) 2169–2175. [CrossRef]
  • A.B. Rosenfeld et al, PIN diode with a wide measurement range of fast neutron doses, Radiation Protection Dosimetry 33 (1990) 75–178.
  • Dante M. Tasca, Pulse modes in failure power semiconductor, IEEE Transactions on Nuclear Science 17 (1970) 364–372. [CrossRef]
  • Ravotti T., et al., “BPW34 commercial p-i-n diodes for high-level 1 MeV neutron equivalent fluence monitoring”, in 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007, 10–14 September 2007.
  • http://www.cmi.cz/index.php?lang=l&wdc=352.