Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films
P. Carbonnelle1,2, S. Ryelandt3, A. Boé2,3, M. Coulombier3, A. Zulfiqar2, U. Bhaskar2, J.P. Raskin2 and T. Pardoen3
MEMS Instruments, 1348
2 Electrical Engineering, Université catholique de Louvain, 1348 Louvain-la-Neuve, Belgium
3 Institute of Mechanics, Materials and Civil engineering, Université catholique de Louvain, 1348 Louvain-la-Neuve, Belgium
Published online: 10 June 2010
This article has no abstract.
© Owned by the authors, published by EDP Sciences, 2010