| Issue |
EPJ Web Conf.
Volume 205, 2019
XXI International Conference on Ultrafast Phenomena 2018 (UP 2018)
|
|
|---|---|---|
| Article Number | 02006 | |
| Number of page(s) | 3 | |
| Section | High Harmonic Generation and Attosecond Science | |
| DOI | https://doi.org/10.1051/epjconf/201920502006 | |
| Published online | 16 April 2019 | |
https://doi.org/10.1051/epjconf/201920502006
Single shot XUV nanoimaging using an intense femtosecond soft X-ray laser
1 Institute of Optics and Quantum Electronics, Abbe Center of Photonics, Jena University, 07743 Jena, Germany
2 Helmholtz Institute Jena, 07743 Jena, Germany
3 Department of Chemistry, University of California, Berkeley, CA 94720, USA
4 LOA, ENSTA, CNRS, Ecole Polytechnique, Université Paris-Saclay, F-91762 Palaiseau cedex, France
5 Ludwig-Maxmrilians-Universität München, Am Coulombwall 1, 85748, Garching, Germany
6 Max-Planck-Institut fur Quantenoptik, Hans-Kopfermann-Str. 1, 85748, Garching, Germany
Published online: 16 April 2019
We report the direct wavefront characterization of an intense ultrafast high-harmonic-seeded soft X-ray laser (λ=32.8 nm) depending on the arrival time of the seed pulses by high-resolution ptychographic imaging and subsequently perform single-shot nanoscale imaging.
© The Authors, published by EDP Sciences, 2019
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