High-speed computational imaging with path-corrected fly-scan ptychography

¹ Advanced Research Center for Nanolithography (ARCNL), Science Park 106, 1098 XG Amsterdam, The Netherlands
² LaserLaB, Vrije Universiteit Amsterdam, De Boelelaan 1081, 1081 HV Amsterdam, The Netherlands
³ Imaging Physics, Faculty of Applied Sciences, Technische Universiteit Delft, Building 22, Lorentzweg 1, 2628 CJ Delft, The Netherlands

^* e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Published online: 22 September 2025

Abstract

Ptychography is a powerful computational imaging technique that reconstructs both the complex object function and the illumination probe from overlapping diffraction patterns. While it provides high-resolution, aberration-corrected imaging, its reliance on stepwise mechanical scanning limits acquisition speed. In this work, we propose a fly-scan ptychographic approach that enables continuous sample translation along arbitrary trajectories, significantly reducing measurement time. To account for motion-induced decoherence, we incorporate an object mode decomposition model combined with automatic differentiation for accurate trajectory correction. This method enables diffraction-limited reconstructions without the need for high-speed tracking, allowing fast and precise measurements using standard ptychographic setups.