| Issue |
EPJ Web Conf.
Volume 335, 2025
EOS Annual Meeting (EOSAM 2025)
|
|
|---|---|---|
| Article Number | 03044 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting - Applications of Optics and Photonics | |
| DOI | https://doi.org/10.1051/epjconf/202533503044 | |
| Published online | 22 September 2025 | |
https://doi.org/10.1051/epjconf/202533503044
Single-pixel birefringence imaging based on dual-comb spectroscopic polarimetry
1 Institute of Post-LED Photonics (pLED), Tokushima University, 2-1, Minami-Josanjima, Tokushima, Tokushima 770-8506, Japan
2 Asai Nursery, 4951 Takanoo-cho, Tsu, Mie, 514-2221, Japan
3 Graduate School of Engineering Science, Univ. Electro-Commun., 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan
4 Graduate School of Engineering Science, Osaka University, 1-3, Machikaneyama, Toyonaka, Osaka 770-8506, Japan
* Corresponding author: This email address is being protected from spambots. You need JavaScript enabled to view it.
Published online: 22 September 2025
Abstract
This study presents a spectroscopic polarimetric imaging system that integrates single-pixel imaging (SPI) with dual-comb spectroscopic polarimetry (DCSP) to achieve scan-less birefringence mapping. The system simultaneously captures amplitude and phase spectra for two orthogonal polarizations using DCSP, while SPI eliminates the need for mechanical scanning through structured illumination with a spatial light modulator. Experimental validation using a USAF 1951 birefringent test chart demonstrated successful reconstruction of spectral-resolved images of amplitude ratio and phase difference, achieving high contrast and effectively resolving coated patterns.
© The Authors, published by EDP Sciences, 2025
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