| Issue |
EPJ Web Conf.
Volume 335, 2025
EOS Annual Meeting (EOSAM 2025)
|
|
|---|---|---|
| Article Number | 03050 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting - Applications of Optics and Photonics | |
| DOI | https://doi.org/10.1051/epjconf/202533503050 | |
| Published online | 22 September 2025 | |
https://doi.org/10.1051/epjconf/202533503050
Using optical tweezers for the surface detection of transparent objects: An indirect optical geometry measurement paradigm
1 University of Bremen, Bremen Institute for Metrology, Automation and Quality Science, Linzer Str. 13, 28359 Bremen, Germany
2 MAPEX Center for Materials and Processes, University of Bremen, 28334 Bremen, Germany
* e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Published online: 22 September 2025
Abstract
While indirect optical geometry measurements do not rely on the optical characteristics of the target’s surface, they depend on the presence of the fluorescent particles in the surrounding medium. In order to overcome uncertainty limits due to the random particle distribution, a well-controlled single particle is applied using an optical tweezer. As a result, the surface of a transparent object is detected via a trapped silica particle to pave the way for more precise indirect optical geometry measurements and to make measurable what is difficult to measure with state-of-the-art direct optical principles.
© The Authors, published by EDP Sciences, 2025
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