| Issue |
EPJ Web Conf.
Volume 335, 2025
EOS Annual Meeting (EOSAM 2025)
|
|
|---|---|---|
| Article Number | 07010 | |
| Number of page(s) | 2 | |
| Section | Topical Meeting - Optical Fiber Technology | |
| DOI | https://doi.org/10.1051/epjconf/202533507010 | |
| Published online | 22 September 2025 | |
https://doi.org/10.1051/epjconf/202533507010
Investigating optical fibers at the nanoscale using X-ray computed tomography
1 Department of Physics and STAR RI, University of Calabria, Via Tito Flavio, 87036 Rende, Italy
2 CNR-NANOTEC, SS di Rende, Via Pietro Bucci, 87036 Rende, Italy
3 Université Paris-Saclay, Institut d’Optique Graduate School, CNRS, 91127 Palaiseau, France
* e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Published online: 22 September 2025
Abstract
We use X-ray computed nanotomography to characterize an optical fiber taper used for nanofiber-based sensors. The resolution achieved goes far beyond the capability of standard optical computed tomography devices.
© The Authors, published by EDP Sciences, 2025
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