| Issue |
EPJ Web Conf.
Volume 363, 2026
International Conference on Low-Carbon Development and Materials for Solar Energy (ICLDMS’26)
|
|
|---|---|---|
| Article Number | 01006 | |
| Number of page(s) | 7 | |
| Section | Energy Materials | |
| DOI | https://doi.org/10.1051/epjconf/202636301006 | |
| Published online | 16 April 2026 | |
https://doi.org/10.1051/epjconf/202636301006
Edge-Based Deep Learning System for Automated PCB Component Inspection
department of Mechatronics Engineering, KCG College of Technology, Karapakkam, Chennai 600 036, India
* Corresponding author: This email address is being protected from spambots. You need JavaScript enabled to view it.
, This email address is being protected from spambots. You need JavaScript enabled to view it.
Published online: 16 April 2026
Abstract
Automatic Optical Inspection (AOI) is essential in Switched Mode Power Supply (SMPS) PCB manufacturing, where missing components can lead to functional failure and safety risks. This paper presents a low-cost embedded deep learning-based AOI system for real-time component verification using a Raspberry Pi 5 as the edge computing platform and a YOLOv11 object detection model to identify critical components such as the fuse, capacitor, MOV, and optocoupler. A dataset of approximately 500 PCB images was collected under varying lighting and orientation conditions and annotated for supervised training. The trained model was optimized and deployed in NCNN format to enable efficient inference on resource-constrained hardware. The complete system integrates conveyor-based PCB handling, Region of Interest (ROI) extraction, and a Finite State Machine (FSM) to ensure stable and synchronized operation. Operating at a 640 x 640 resolution, the system achieves 5-10 FPS with an average inspection time of approximately 3 seconds per PCB. Based on detection results, automatic PASS/FAIL classification and actuator-based sorting are performed.
Key words: Automatic Optical Inspection (AOI) / SMPS PCB Inspection / Embedded Vision System / Deep Learning / YOLOv11 / Raspberry Pi 5 / NCNN Deployment / Real-Time Object Detection / Finite State Machine (FSM) / Conveyor-Based Automation
© The Authors, published by EDP Sciences, 2026
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.

