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Cited article:

Microwave diagnostic at Wendelstein 7-X

A. Krämer-Flecken, N. Chaudhary, J. Guerrero Arnaiz, M. Hirsch, D. López-Rodríguez, D. Moseev, H. Oosterbeek, G. Weir, T. Windisch, D. Carralero, T. Estrada, X. Han, E. Maragkoudakis, V. Murugesan, V. Nair and S. Ponomorenko
Journal of Instrumentation 20 (12) C12008 (2025)
https://doi.org/10.1088/1748-0221/20/12/C12008