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Cited article:

Refractive index and thickness analysis of planar interfaces by prism coupling technique

Paulo Lourenço, Yuri Vygranenko, Miguel Fernandes, Alessandro Fantoni, Manuela Vieira

EPJ Web Conf., 305 (2024) 00023

Published online: 2024-10-15

DOI: https://doi.org/10.1051/epjconf/202430500023

This article has been cited by the following article(s):

Enhancing Photocatalysis, Self-Cleaning, and Waveguiding in Ni-Doped ZnO Thin Films for Optoelectronic and Environmental Remediation Applications

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Journal of Materials Engineering and Performance (2026)
https://doi.org/10.1007/s11665-026-13441-w

M-Lines Spectroscopy for Thin Films: A New Perspective

Paulo Lourenço and Alessandro Fantoni
Photonics 13 (1) 15 (2025)
https://doi.org/10.3390/photonics13010015