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Cited article:

Focused electron beam induced deposition of magnetic tips for improved magnetic force microscopy

A. T. Escalante-Quiceno, V. V. Fernández, J. I. Martín, A. Hierro-Rodriguez, G. Hlawacek, M. Jaafar, A. Asenjo, C. Magén and J. M. De Teresa
Low Temperature Physics 50 (10) 825 (2024)
https://doi.org/10.1063/10.0028622

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition

Alix Tatiana Escalante-Quiceno, Ondřej Novotný, Jan Neuman, César Magén and José María De Teresa
Sensors 23 (6) 2879 (2023)
https://doi.org/10.3390/s23062879

High Coercivity and Resolution FePt•MgO-coated Tip for Imaging the Magnetic Field of Perpendicular Magnetic Write Head by Alternating Magnetic Force Microscopy (A-MFM)

F. Zheng, S. Yoshimura, S. Yasui, G. Egawa and H. Saito
Journal of the Magnetics Society of Japan 43 (1) 6 (2019)
https://doi.org/10.3379/msjmag.1901R002

AC Magnetic Field Imaging of Perpendicular Magnetic Write Head without Image Distortion on Alternating Magnetic Force Microscopy using a Cone-Shape FePt-coated Tip

S. Yoshimura, F. Zheng, S. Yasui, G. Egawa and H. Saito
Journal of the Magnetics Society of Japan 42 (1) 5 (2018)
https://doi.org/10.3379/msjmag.1801R002

Response of Magnetic Force Microscopy Probes under AC Magnetic Field

A Sungthong, P Ruksasakchai, K Saengkaew, I Cheowanish and B Damrongsak
Journal of Physics: Conference Series 901 (1) 012092 (2017)
https://doi.org/10.1088/1742-6596/901/1/012092