Articles citing this article

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Cited article:

Reversibility of surface damage induced in SiC detectors by low intensity laser plasma

A. Sciuto, G. D’Arrigo, M. Mazzillo, L. Torrisi and L. Calcagno
Materials Science in Semiconductor Processing 86 36 (2018)
https://doi.org/10.1016/j.mssp.2018.06.015

Electron spectroscopy with a commercial 4H-SiC photodiode

S. Zhao, G. Lioliou, S. Butera, M.D.C. Whitaker and A.M. Barnett
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 910 35 (2018)
https://doi.org/10.1016/j.nima.2018.09.017