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Cited article:

Electromagnetic modeling of interference, confocal, and focus variation microscopy

Tobias Pahl, Felix Rosenthal, Johannes Breidenbach, Corvin Danzglock, Sebastian Hagemeier, Xin Xu, Marco Künne and Peter Lehmann
Advanced Photonics Nexus 3 (01) (2024)
https://doi.org/10.1117/1.APN.3.1.016013