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Cited article:

Stability of masking materials for pattern transfer of lithographic masks into fused silica by atmospheric pressure plasma jet etching

Robert Heinke, Lukáš Šilhan, Martin Ehrhardt, Pierre Lorenz, Joachim Zajadacz, Jens Bauer, Thomas Arnold, Mojmír Šerý and Klaus Zimmer
Micro and Nano Engineering 28 100309 (2025)
https://doi.org/10.1016/j.mne.2025.100309