Very slow creep tests on salt samplesP. Bérest, J.F. Béraud, B. Brouard, P.A. Blum, J.P. Charpentier, V. de Greef, H. Gharbi and F. ValèsEPJ Web of Conferences, 6 (2010) 22002DOI: https://doi.org/10.1051/epjconf/20100622002
