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Mechanical characterization of nanostructured thin films at different scales

S. Djaziri, D. Thiaudière, G. Geandier, P.O. Renault, E. Le Bourhis, P. Goudeau, R.N. Randriamazaoro, R. Chiron, O. Castelnau, D. Faurie and F. Hild

EPJ Web of Conferences, 6 (2010) 26003

DOI: https://doi.org/10.1051/epjconf/20100626003

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