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X-ray strain analysis in thin films enhanced by 2D detection

G. Geandier, D. Faurie, P.O. Renault, C. Le Bourlot, P. Djemia, O. Castelnau, S.M. Chérif, E. Le Bourhis and P. Goudeau

EPJ Web of Conferences, 6 (2010) 26008

DOI: https://doi.org/10.1051/epjconf/20100626008

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