Influence of microstructure and internal stress on the mechanical behavior of electroplated gold freestanding thin filmsJ. Martegoutte, C. Seguineau, T. Fourcade, C. Malhaire, P. Martins, J.M. Desmarres and X. LafontanEPJ Web of Conferences, 6 (2010) 26009DOI: https://doi.org/10.1051/epjconf/20100626009