Copper-Rubber Interface Delamination in Stretchable ElectronicsJ. Neggers, J.P.M. Hoefnagels, P.H.M. Timmermans and M.G.D. GeersEPJ Web of Conferences, 6 (2010) 42019DOI: https://doi.org/10.1051/epjconf/20100642019
