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Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films

P. Mota–Santiago, D. Schauries, A. Nadzri, K. Vora, M. C. Ridgway and P. Kluth

EPJ Web of Conferences, 91 (2015) 00008

DOI: https://doi.org/10.1051/epjconf/20159100008

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