The deteriorating effect of plasma density fluctuations on microwave beam quality
Alf Köhn, Max E. Austin, Michael W. Brookman, Kenneth W. Gentle, Lorenzo Guidi, Eberhard Holzhauer, Rob J. La Haye, Jarrod B. Leddy, Omar Maj, Craig C. Petty, Emanuele Poli, Antti Snicker, Matthew B. Thomas, Roddy G. L. Vann and Hannes Weber
EPJ Web Conf., 203 (2019) 01005
DOI: https://doi.org/10.1051/epjconf/201920301005