Ion beam induced current analysis in GaN microwiresDirkjan Verheij, Marco Peres, Susana Cardoso, Luís Cerqueira Alves, Eduardo Alves, Cristophe Durand, Joël Eymery, Jorge Fernandes and Katharina LorenzEPJ Web Conf., 233 (2020) 05001DOI: https://doi.org/10.1051/epjconf/202023305001
