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Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods

Antonio Barion, Martijn J. H. Anthonissen, Jan H. M. ten Thije Boonkkamp and Wilbert L. IJzerman

EPJ Web Conf., 266 (2022) 02002

DOI: https://doi.org/10.1051/epjconf/202226602002

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