Article citations

Download citation

Optical Characterisation of Doped Silicon Wafers Using THz Time-Domain Ellipsometry

Zahra Mazaheri, Maurizio Casalino, Mario Iodice, Gianpaolo Papari, Roberto Russo and Antonello Andreone

EPJ Web Conf., 309 (2024) 09006

DOI: https://doi.org/10.1051/epjconf/202430909006

Back to the article