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Material-resolved and thickness-sensitive lensless imaging using high-harmonic generation: From diffractive shear interferometry to ptychography

Fengling Zhang, Xiaomeng Liu, Antonios Pelekanidis, Matthias Gouder, Kjeld Eikema and Stefan Witte

EPJ Web Conf., 335 (2025) 01012

DOI: https://doi.org/10.1051/epjconf/202533501012

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