Nanometer-resolution hard X-ray near-field ptychography with multilayer Laue lenses
Wenhui Zhang, Jan Lukas Dresselhaus, Holger Fleckenstein, Mauro Prasciolu, Margarita Zakharova, Nikolay Ivanov, Chufeng Li, Oleksandr Yefanov, Tang Li, Dmitry Egorov, Ivan De Gennaro Aquino, Philipp Middendorf, Sasa Bajt and Henry Chapman
