Robust meta-surface designs for ultra-high reflectivity in precision interferometryChristian Kranhold, Mika Gaedtke, Markus Walther, Falk Eilenberger, Stefanie Kroker and Thomas SiefkeEPJ Web Conf., 335 (2025) 05015DOI: https://doi.org/10.1051/epjconf/202533505015
