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RTL validation methodology on high complexity wireless microcontroller using OVM technique for fast time to market

Nurul Zhafirah Muhammad, A. Harun, N.A.M.A. Hambali, S. A. Z. Murad, S. N. Mohyar, M.N. Isa and AB Jambek

EPJ Web Conf., 162 (2017) 01068

DOI: https://doi.org/10.1051/epjconf/201716201068

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