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Ellipsometry as an express method for determining the pore parameters of ion-track SiO₂ templates on a silicon substrate

Victoria Bundyukova, Egor Kaniukov, Alena Shumskaya, Andrey Smirnov, Maksim Kravchenko and Dzmitry Yakimchuk

EPJ Web Conf., 201 (2019) 01001

DOI: https://doi.org/10.1051/epjconf/201920101001

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