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Beta decay along the N=Z line and its relevance in rp-process and X-Ray bursts

E. Nácher, S. Parra, J.A. Briz, P. Aguilera, J. Agramunt, A. Algora, T. Berry, M.J.G. Borge, M. Carmona, L.M. Fraile, E. Ganioglu, W. Gelletly, V. Guadilla, A. Illana, R. Lică, I. Marroquín, F. Molina, A.I. Morales, N. Orce, S.E.J. Orrigo, A. Perea, J. Romero, B. Rubio, C. Sotty, J.L. Taín, O. Tengblad and A. Tolosa

EPJ Web Conf., 279 (2023) 12004

DOI: https://doi.org/10.1051/epjconf/202327912004

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