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Application of the extended bias factor method for highly reliable benchmark suite

Mikio Tokashiki, Tadashi Ikehara, Kenichi Tada, Tohru Egawa, Kenji Yokoyama and Osamu Iwamoto

EPJ Web Conf., 281 (2023) 00002

DOI: https://doi.org/10.1051/epjconf/202328100002

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