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A new technique for quick identification of defective region inside γ-ray detector

Biswajit Das, R. Palit, A. Kundu, P. Dey, V. Malik, S.K. Jadav, B.S. Naidu and A.T. Vazhappilly

EPJ Web Conf., 288 (2023) 10003

DOI: https://doi.org/10.1051/epjconf/202328810003

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