Influence of base material thickness on spectrometry of semiconductor detectors based on semi-insulating GaAsAndrea Šagátová, Nikola Kurucová, Soňa Kotorová, Eva Kováčová and Bohumír ZaťkoEPJ Web Conf., 288 (2023) 10013DOI: https://doi.org/10.1051/epjconf/202328810013