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Thermometry with embedded SI traceability for industrial applications

Jonathan Pearce, Henrik Kjeldsen, Jan Nielsen, Ingmar Müller, Christian Krause, Gavin Sutton, Alexander Fateev and Aurik Andreu

EPJ Web Conf., 323 (2025) 07001

DOI: https://doi.org/10.1051/epjconf/202532307001

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