Article citations

Download citation

Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz

Daouda Seck, Djamel Allal, Florent Marlec, Clément Lenoir, Mohamed Sebbache and Kamel Haddadi

EPJ Web Conf., 323 (2025) 12003

DOI: https://doi.org/10.1051/epjconf/202532312003

Back to the article