EPJ Web of Conferences

IT Security Standards and Legal Metrology – Transfer and Validation

F. Thiel, V. Hartmann, U. Grottker and D. Richter

EPJ Web of Conferences, 77 (2014) 00001

Published online: 19 August 2014

DOI: 10.1051/epjconf/20147700001

F. Thiel

V. Hartmann

U. Grottker

D. Richter

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