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Gate recess study for high thermal stability pHEMT devices

M. Mohamad Isa, N. Ahmad, Siti S. Mat Isa, Muhammad M. Ramli, N. Khalid, N.I. M. Nor, S.R. Kasjoo and M. Missous

EPJ Web Conf., 162 (2017) 01047

Published online: 22 November 2017

DOI: 10.1051/epjconf/201716201047

M. Mohamad Isa

N. Ahmad

Siti S. Mat Isa

Muhammad M. Ramli

N. Khalid

N.I. M. Nor

S.R. Kasjoo

M. Missous

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Articles written by ANY OF the selected authors (OR)

eISSN: 2100-014X