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Statistical sensitivity of the nEDM apparatus at PSI to n − n′ oscillations

C. Abel, N.J. Ayres, G. Bison, K. Bodek, V. Bondar, P.-J. Chiu, M. Daum, S. Emmenegger, P. Flaux, L. Ferraris-Bouchez et al. (27 more)

EPJ Web Conf., 219 (2019) 07001

Published online: 12 December 2019

DOI: 10.1051/epjconf/201921907001

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