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Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods

Antonio Barion, Martijn J. H. Anthonissen, Jan H. M. ten Thije Boonkkamp and Wilbert L. IJzerman

EPJ Web Conf., 266 (2022) 02002

Published online: 13 October 2022

DOI: 10.1051/epjconf/202226602002

Antonio Barion

Martijn J. H. Anthonissen

Jan H. M. ten Thije Boonkkamp

Wilbert L. IJzerman

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