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Nanometer-resolution hard X-ray near-field ptychography with multilayer Laue lenses

Wenhui Zhang, Jan Lukas Dresselhaus, Holger Fleckenstein, Mauro Prasciolu, Margarita Zakharova, Nikolay Ivanov, Chufeng Li, Oleksandr Yefanov, Tang Li, Dmitry Egorov et al. (4 more)

EPJ Web Conf., 335 (2025) 01015

Published online: 22 September 2025

DOI: 10.1051/epjconf/202533501015

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