EPJ Web of Conferences

Theoretical investigation of defect-induced electronic transport degradation in 2D semiconductors using DFT-derived parameters

Ayushi Sharma and Uma Shankar Sharma

EPJ Web Conf., 356 (2026) 01030

Published online: 05 March 2026

DOI: 10.1051/epjconf/202635601030

Ayushi Sharma

Uma Shankar Sharma

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