EPJ Web of Conferences

A new approach to numerical analysis of reliability indices in electronics

Kuznetsov Geniy and Kravchenko Evgeny

EPJ Web of Conferences, 82 (2015) 01029

Published online: 20 January 2015

DOI: 10.1051/epjconf/20158201029

Kuznetsov Geniy

Kravchenko Evgeny

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