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Beta decay along the N=Z line and its relevance in rp-process and X-Ray bursts

E. Nácher, S. Parra, J.A. Briz, P. Aguilera, J. Agramunt, A. Algora, T. Berry, M.J.G. Borge, M. Carmona, L.M. Fraile et al. (17 more)

EPJ Web Conf., 279 (2023) 12004

Published online: 22 March 2023

DOI: 10.1051/epjconf/202327912004

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