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Thermometry with embedded SI traceability for industrial applications

Jonathan Pearce, Henrik Kjeldsen, Jan Nielsen, Ingmar Müller, Christian Krause, Gavin Sutton, Alexander Fateev and Aurik Andreu

EPJ Web Conf., 323 (2025) 07001

Published online: 07 April 2025

DOI: 10.1051/epjconf/202532307001

Jonathan Pearce

Henrik Kjeldsen

Jan Nielsen

Ingmar Müller

Christian Krause

Gavin Sutton

Alexander Fateev

Aurik Andreu

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Articles written by ANY OF the selected authors (OR)

eISSN: 2100-014X