Issue |
EPJ Web Conf.
Volume 287, 2023
EOS Annual Meeting (EOSAM 2023)
|
|
---|---|---|
Article Number | 02002 | |
Number of page(s) | 2 | |
Section | Topical Meeting (TOM) 2- Adaptive and Freeform Optics | |
DOI | https://doi.org/10.1051/epjconf/202328702002 | |
Published online | 18 October 2023 |
https://doi.org/10.1051/epjconf/202328702002
Complex illumination system for fast interferometric measurements
Universität Stuttgart, Institut für Technische Optik, Pfaffenwaldring 9, 70569 Stuttgart, Germany
* Corresponding author: schober@ito.uni-stuttgart.de
Published online: 18 October 2023
Freeform metrology is an enabling technology for today’s research and advanced manufacturing. The Tilted Wave Interferometer is a full field measurement system for fast and flexible measurements. It is based on an off-axis illumination scheme based on a microlens array. In this contribution, we present a novel illumination system for the tilted wave interferometer, that allows to reduce the measurement time by a factor of four using parallelization based on wavelength multiplexing. Here we present a design solution that utilizes the flexibility of 3D-printing. The microlenses are realized as multi-order diffractive optical elements, providing a high efficiency compared to colorfilter based realizations. To boost the light efficiency of the novel illumination system further, a field lens functionality is added to the system by adding individual micro-prisms to each microlens. The system is manufactured by the use of grayscale two-photon polymerisation.
© The Authors, published by EDP Sciences, 2023
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