Issue |
EPJ Web of Conferences
Volume 5, 2010
API'09 - First NanoCharM Workshop on Advanced Polarimetric Instrumentation
|
|
---|---|---|
Article Number | 06005 | |
Number of page(s) | 1 | |
Section | New frontiers in polarimetry | |
DOI | https://doi.org/10.1051/epjconf/20100506005 | |
Published online | 02 June 2010 |
https://doi.org/10.1051/epjconf/20100506005
Multiplexed optical data storage and vectorial ray tracing
The Blackett Laboratory, Imperial College London,
SW7 2BW,
United Kingdom
With the motivation of creating a terabyte-sized optical disk, a novel imaging technique is implemented. This technique merges two existing technologies: confocal microscopy and Mueller matrix imaging. Mueller matrix images from a high numerical space are obtained. The acquisition of these images makes the exploration of polarisation properties in a sample possible. The particular case of optical data storage is used as an example in this presentation. Since we encode information into asymmetric datapits (see Figure 1), the study of the polarisation of the scattered light can then be used to recover the orientation of the pit. It is thus possible to multiplex information by changing the angle of the mark. The storage capacity in the system is hence limited by the number of distinct angles that the optical system can resolve. This presentation thus answers the question; what is the current storage capacity of a polarisation sensitive optical disk? After a brief introduction to polarisation, the decoding method and experimental results are presented so as to provide an answer to this question. With the aim of understanding high NA focusing, an introduction to vectorial ray tracing is then given.
© Owned by the authors, published by EDP Sciences, 2010
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.