EPJ Web of Conferences
Volume 29, 2012EMM-FM2011 – First Euro Mediterranean Meeting on Functionalized Materials
|Number of page(s)||11|
|Published online||18 June 2012|
Effect of Gaussian doping profile on the performance of a thin film polycrystalline solar cell
1 Research Unit Advanced and Control and Energy Management, ACEM, Department of Electrical Engineering, Sfax National Engineering School, University of Sfax, BP. 1173, 3038 Sfax, Tunisia
2 Department of Physics, Science Faculty of Sfax, University of Sfax, BP. 1171, 3000 Sfax, Tunisia
3 Electronic Laboratory and Information Technology, LETI, Department of Electrical Engineering, Sfax National Engineering School, University of Sfax, BP. 1173, 3038 Sfax, Tunisia
a e-mail: firstname.lastname@example.org
A two-dimensional (2D) analytical model based on the Green’s function method is applied to an n+-p thin film polycrystalline solar cell that allows us to calculate the conversion efficiency. This model considers the effective Gaussian doping profile in the p region in order to improve cell efficiency. The dependence of mobility and lifetime on grain doping is also investigated. This model is implemented through a simulation program in order to optimize conversion efficiency while varying thickness and doping profile in the base region of the cell. Compared with n+-p standard structure, our proposed structure shows a 43% improvement in conversion efficiency for a polycrystalline solar cell.
PACS: 85.30.De – Semiconductor-device characterization design and modelling / 88.40.hj – Efficiency and performance of solar cells
© Owned by the authors, published by EDP Sciences, 2012
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.