| Issue |
EPJ Web of Conferences
Volume 41, 2013
XVIIIth International Conference on Ultrafast Phenomena
|
|
|---|---|---|
| Article Number | 12002 | |
| Number of page(s) | 3 | |
| Section | Optics, Optoelectronics, Measurement, Diagnostic, and Applications | |
| DOI | https://doi.org/10.1051/epjconf/20134112002 | |
| Published online | 13 March 2013 | |
https://doi.org/10.1051/epjconf/20134112002
Self-referenced spectral interferometry for ultra-short infrared pulse characterization
1 Paul Scherrer Institute, SwissFEL, 5232 Villigen PSI, Switzerland
2 Fastlite, Centre Scientifique d’Orsay, Bat 503, Plateau du Moulon, BP45, 91401 Orsay, France
3 Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland
Self-Referenced Spectral Interferometry is used for single shot pulse characterization over the 0.9-2.5 µm spectral range with a single spectrometer and an optimized optical setup. We characterize sub-55 fs pulses from 1.4 µm to 2 µm and broadband 2.5-cycle pulses at 1.65 µm (13 fs FWHM).
© Owned by the authors, published by EDP Sciences, 2013
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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