Extracting information from partially depleted Si detectors with digital sampling electronics

G. Pastore; G. Pasquali; N. Le Neindre; G. Ademard; S. Barlini; M. Bini; E. Bonnet; B. Borderie; R. Bougault; G. Casini; A. Chbihi; M. Cinausero; J.A. Dueñas; P. Edelbruck; J.D. Frankland; F. Gramegna; D. Gruyer; A. Kordyasz; T. Kozik; O. Lopez; T. Marchi; L. Morelli; A. Olmi; A. Ordine; M. Pârlog; S. Piantelli; G. Poggi; M.-F. Rivet; E. Rosato; F. Salomon; G. Spadaccini; A.A. Stefanini; S. Valdré; E. Vient; T. Twaróg; R. Alba; C. Maiolino; D. Santonocito

doi:10.1051/epjconf/20158801013

All issues

Volume 88 (2015)

EPJ Web of Conferences, 88 (2015) 01013

Abstract

Open Access

Issue		EPJ Web of Conferences Volume 88, 2015 IWM-EC 2014 – International Workshop on Multi facets of EoS and Clustering


Article Number		01013
Number of page(s)		4
DOI		https://doi.org/10.1051/epjconf/20158801013
Published online		24 April 2015

EPJ Web of Conferences 88, 01013 (2015)
https://doi.org/10.1051/epjconf/20158801013

Extracting information from partially depleted Si detectors with digital sampling electronics

G. Pastore¹^,2, G. Pasquali¹^,2, N. Le Neindre³, G. Ademard⁴, S. Barlini¹^,2, M. Bini¹^,2, E. Bonnet⁵, B. Borderie⁴, R. Bougault³, G. Casini², A. Chbihi⁵, M. Cinausero⁶, J.A. Dueñas⁷, P. Edelbruck⁴, J.D. Frankland⁵, F. Gramegna⁶, D. Gruyer⁵, A. Kordyasz⁸, T. Kozik⁹, O. Lopez³, T. Marchi⁶, L. Morelli¹⁰, A. Olmi², A. Ordine¹¹, M. Pârlog³^,12, S. Piantelli², G. Poggi¹^,2, M.-F. Rivet⁴, E. Rosato¹¹^,13, F. Salomon⁴, G. Spadaccini¹¹^,13, A.A. Stefanini¹^,2, S. Valdré¹^,2, E. Vient³, T. Twaróg⁹, R. Alba¹⁴, C. Maiolino¹⁴ and D. Santonocito¹⁴

¹ Dipartimento di Fisica, Università di Firenze, Firenze, Italy
² INFN, Sezione di Firenze, Firenze, Italy
³ LPC, IN2P3-CNRS, ENSICAEN and Université de Caen, France
⁴ IPN, CNRS/IN2P3, Université Paris Sud 11, Paris, France
⁵ GANIL, CEA/DSM-CNRS/IN2P3, Caen, France
⁶ INFN-LNL Legnaro (PD), Italy
⁷ Dep. de Fisica Aplicada, FCCEE Univ. de Huelva, Huelva, Spain
⁸ Heavy Ion Laboratory, University of Warsaw, Warsaw, Poland
⁹ Jagiellonian Univ., Institute of Nuclear Physics IFJ-PAN, Kraków, Poland
¹⁰ INFN, Sezione di Bologna and Università di Bologna, Italy
¹¹ INFN, Sezione di Napoli, Napoli, Italy
¹² NIPNE-HH, Măgurele-Bucharest, Romania
¹³ Dipartimento di Fisica, Università di Napoli “Federico II”, Napoli, Italy
¹⁴ INFN-LNS, Catania, Italy

Published online: 24 April 2015

Abstract

A study of the identification properties and of the energy response of a Si-Si-CsI(Tl) ΔE-E telescope exploiting a partially depleted second Si stage has been performed. Five different bias voltages have been applied to the second stage of the telescope, one corresponding to full depletion, the others associated with a depleted layer ranging from 60% to 90% of the detector thickness. Fragment identification has been obtained using either the ΔE-E technique or the Pulse Shape Analysis (PSA). Charge collection efficiency has been evaluated. The ΔE-E performance is not affected by incomplete depletion. Isotopic separation capability improves at lower bias voltages with respect to full depletion, though charge identification thresholds increase.

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