EPJ Web Conf.
Volume 132, 2017XXV-th Congress on Spectroscopy
|Number of page(s)||2|
|Published online||13 December 2016|
IR surface polariton spectroscopy as a method for studying the optical properties of ultra thin films
Institute for spectroscopy RAS, 108840 Troitsk, Moscow, Russia
* Corresponding author: firstname.lastname@example.org
Published online: 13 December 2016
Experimental results of investigation of optical properties of MgO thin films (thickness 10, 30, 100 и 300 nm) and AlN films (thickness 40 и 400 nm) on sapphire substrate are discussed. The optical phonon frequencies of these films are located in frequency region of surface polariton of sapphire. Due to the resonance between them the splitting and the shift of absorption spectra of sapphire surface polariton appear. From these experimental data it is possible to reconstruct all constants of the permittivity of both the film and substrate, the film thickness, and to specify its structure.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.